SCANNING ELECTRON MICROSCOPY

Description

Scanning Electron Microscopy (SEM) is a technique that allows ultra-high-resolution imaging of surface morphology at the sub-micrometer scale, with resolutions down to a few tens of nanometers. The SEM operates by directing a focused beam of high-energy electrons onto the sample surface. Interactions between the electrons and the sample produce various signals that are detected and converted into detailed images, revealing surface structure, texture, and topography.

In addition to imaging, the SEM at CIRCE is equipped with Energy Dispersive X-ray Spectroscopy (EDS), enabling elemental analysis. EDS allows identification and quantification of the chemical elements present in selected areas of the sample, providing critical information about its composition.